Pontificia Universidad Católica de Chile Pontificia Universidad Católica de Chile
Mery, D, Arteta C. (2017): Automatic Defect Recognition in X-ray Testing using Computer Vision, 2017 IEEE Winter Conference on Applications of Computer Vision (WACV2017), Santa Rosa, CA, 27-29 March. (2017)

Automatic Defect Recognition in X-ray Testing using Computer Vision

Revista : Proceedings of the 2017 IEEE Winter Conference on Applications of Computer Vision (WACV2017)
Tipo de publicación : Conferencia No DCC

Abstract

To ensure safety in the construction of important metallic components for roadworthiness, it is necessary to check every component thoroughly using non-destructive testing. In last decades, X-ray testing has been adopted as the principal non-destructive testing method to identify defects within a component which are undetectable to the naked eye. Nowadays, modern computer vision techniques, such as deep learning and sparse representations, are opening new avenues in automatic object recognition in optical images. These techniques have been broadly used in object and texture recognition by the computer vision community with promising results in optical images. However, a comprehensive evaluation in X-ray testing is required. In this paper, we release a new dataset containing around 47.500 cropped X-ray images of 32 x 32 pixels with defects and no-defects in automotive components. Using this dataset, we evaluate and compare 24 computer vision techniques including deep learning, sparse representations, local descriptors and texture features, among others. We show in our experiments that the best performance was achieved by a simple LBP descriptor with a SVM-linear classifier obtaining 97% precision and 94% recall. We believe that the methodology presented could be used in similar projects that have to deal with automated detection of defects.