Home » Publicaciones » Strain rate measurement by Electronic Speckle pattern Interferometry: A new look at strain localization onset

Guelorget B., Francois M., Vial – Edwards C., Montay G., Daniel L., Lu J. (2006)

Strain rate measurement by Electronic Speckle pattern Interferometry: A new look at strain localization onset

Revista : Materials Science & Engineering A
Volumen : 415
Páginas : 234-241
Tipo de publicación : ISI